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| THE DIVISIONS |
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| In-House Screening Options for 'Mil Processed' Conformance |
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QR205: Group A - Electrical Tests
| * small lot conference |
| Subgroup |
Description |
LTPD |
Sample* |
Reject |
|
| 1 |
Visual & mechanical Inspection |
5 |
45 |
0 |
|
| 2 |
DC electrical tests at 25°C |
5 |
45 |
0 |
|
| 3 |
DC electrical tests at maximum and minimum rated
operating temperature |
30 |
8 |
0 |
|
| 4 |
AC electrical tests at 25°C |
30 |
8 |
0 |
|
| 5 |
Safe Operating Area (Power Transistors)
- DC
- Clamped Inductive
- Unclamped Inductive
Endpoint electrical measurements |
30 |
8 |
0 |
|
The specified parameters to be included in each subgroup shall be as per the detail specification.
Where no parameters have been specified in a particular subgroup or test within a subgroup, no Group A testing is required for that subgroup or test to satisfy Group A reqmnts.
A single sample may be used for all subgroup testing. These tests are considered non-destructive. |
QR205: Group B - Short Term Environmental & Endurance Tests
| * small lot conference |
| Test |
Note |
MIL-STD-750
method |
Condition |
Sample* |
Reject |
|
Subgroup 1
Solderability
Resistant to solvents |
(1)
(3) |
2026
1022 |
Separate samples can be
used for each test |
4 leads
3 devices |
1 |
|
Subgroup 2
Thermal shock
(temperature cycling)
Hermetic seal
(a) Fine Leak
(b) Gross Leak
Electrical Measurements |
|
1051
1071 |
No dwell is required at 25°C.
Test condition C1 (25 cycles),
temp extreme, >= 10 mins
Test condition G or H.
Max leak =5x10-8 atm cc/s,
(5x10-7 atm cc/s for <0.3cc) |
6 |
0 |
|
Subgroup 3
Steady-state operation life
or
Intermittent operation life
or
Blocking Life
Electrical Measurements
Bond Strength |
(4) |
1027
1037
-
2037 |
340hrs at specified bias conditions
As specified
|
12
11 wires |
0
0 |
|
Subgroup 4
Internal visual design verification |
(5) |
2075 |
Visual criteria in accordance
with qualified design. |
1 |
0 |
|
Subgroup 5
Thermal resistance |
|
QA1023 |
As specified ref SEMELAB SPEC |
6 |
0 |
|
Subgroup 6
High temperature life
(non operating)
Electrical Measurements |
|
1032 |
340hrs high temperature
storage
As specified
|
12 |
0 |
|
QR205: Group C - Periodic Inspection
| * small lot conference |
| Test |
Note |
MIL-STD-750
method |
Condition |
Sample* |
Reject |
|
Subgroup 1
Physical dimension |
|
2066 |
Dimensions per case outline specified |
6
|
0 |
|
Subgroup 2
Thermal shock
(glass strain)
Terminal strength
Hermetic seal
(a) Fine Leak
(b) Gross leak
Moisture resistance
Electrical measurements |
|
1056
2036
1071
1071
1021 |
Test condition A, except for
devices> 10W at T=25°C
which is condition B.
As specified
a) Test condition H. Max leak rate =5x10-8 atm cc/s, (5x10-7 atm cc/s for internal cavity <0.3cc)
b) Test condition C
Omit initial conditioning
As specified |
6 |
0 |
|
Subgroup 3
Shock
Vibration
(variation frequency)
Constant acceleration
Electrical Measurments |
(4) |
2016
2056
2006 |
Non-operating, 1500G, 0.5ms,
5 blows in each orientation, X1, Y1, Z1
1 minute min. in each orientation, X1, Y1, Z1at 20000G min, except at 10000G min
if device ≥ 15W at TC=25°C
As specified
|
6 |
0 |
|
Subgroup 4
Salt atmosphere
(corrosion) |
(1) |
1041 |
|
6 |
0 |
|
Subgroup 5
Barometric pressure (reduced)
only on devices > 2000V
|
|
1001 |
If and as specified |
8 |
1 |
|
Subgroup 6
Steady-state operation life
or
Intermittent operation life
or
Blocking life
Electrical Measurments
|
|
1026
1036 |
1000hrs at max operating
junction temp
As specified
|
12 |
0 |
|
- Electrical reject devices from the same inspection lot may be used for all subgroups when electrical end point measurements are not required.
- Post burn-in electrical rejects may be used.
- The LTPD for solderability test applies to the number of leads inspected except in no case shall less than three devices be used to provide the number of leads required.
- If a given inspection lot undergoing Group B inspection has been selected to satisfy Group C inspection requirements, the 340 hour life test may be continued to 1000 hours in order to satisfy the Group C life test requirements. In such cases, either the 340 hour end point measurements must be made as a basis for Group B lot acceptance or the 1000 hour end point measurement shall be used as the basis for both Group B and Group C acceptance.
- Subgroup 4 may be omitted if the devices have been manufactured by Semelab as sample pre-cap visual inspection will have been performed.
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Notes:
- Group A end point tests are DC functional / parametric at 25°C (subgroup 2) of QR205.
- 10000G force for devices with power rating >10 watts at Tc=25°C.
- PDA (percentage defects allowable) is 10% between steps 9 & 11 and 11& 13.
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